T8800 series

Triertech T8800: An exceptional dual-sided final inspection AOI, powered by industry-exclusive AI vision technology for high-precision defect capture.

Product features

Dual-Sided 2D Final Inspection AOI: Industry-exclusive AI-powered inspection targets complex surface defects, seamlessly automating and replacing manual final inspection.
Synchronized Dual-Camera Motion: Independent interlocked imaging prevents optical interference caused by opposing top-and-bottom illumination.
Self-Evolving AI Algorithms: Continuous defect data collection fuels model iteration, driving steady increases in detection accuracy.
Powerful SPC Analytics: Integrated Statistical Process Control (SPC) software provides rich, high-precision analytical insights.

1.靈活的定位演算法,相容於不同背景和色差的產品。
2.高精度缺陷偵測演算法,包括影像增強、邊緣偵測、模板匹配等演算法,能夠精確辨識微小的缺陷,如裂縫、刮痕、異物和焊點缺陷等。
(1)影像增強:透過對比度調整等方法,提高影像質量,增強缺陷的可識別性
(2)邊緣偵測:利用如Canny等邊緣偵測演算法,精確辨識晶圓表面的邊緣特徵
(3)模板匹配:透過與標準模板進行比對學習,快速識別出不符合規範的區域
3.高精度測量演算法,包括特徵提取等演算法,利用邊界追蹤演算法提取物體的輪廓訊息,可以精確測量產品上各類特徵(如接觸孔、導線寬度、間距等)的尺寸。

Product specifications